e/Singleevent upset

Information
has gloss	eng: A single event upset (SEU) is a change of state caused by a low-energy ions or electro-magnetic or nuclear radiation or any other kind of interferences that can reach (called "strike") a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors. The error in the device output or operation caused as a result of the strike is called an SEU or a soft error. The SEU itself is not considered permanent damage to the transistors, circuits or devices'.
has gloss	eng: A single event upset (SEU) is a change of state caused by ions or electro-magnetic radiation striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors. The state change is a result of the free charge created by ionization in or close to an important node of a logic element (e.g. memory "bit"). The error in device output or operation caused as a result of the strike is called an SEU or a soft error. The SEU itself is not considered permanently damaging to the transistors or circuits functionality unlike the case of single event latchup (SEL), single event gate rupture (SEGR), or single event burnout (SEB). These are all examples of a general class of radiation effects in electronic devices called single event effects.
lexicalization	eng: Single event upset
lexicalization	eng: Single-event upset
lexicalization	eng: Singleevent upset
instance of	c/simple/Electronic components

Meaning
German
has gloss	deu: Ein Single Event Upset (SEU) ist ein Soft Error (deutsch: „weicher“ Fehler), der in Halbleiterbauelementen beim Durchgang hochenergetischer ionisierender Teilchen (z. B. Schwerionen, Protonen) hervorgerufen werden kann. Dies äußert sich beispielsweise als bitflip (Änderung des Zustandes eines Bits) in Speicherbausteinen oder Registern, was zu einer Fehlfunktion des betroffenen Bauteils führen kann. Die Klassifizierung als soft error rührt daher, dass ein SEU keinen dauerhaften Schaden am betroffenen Bauteil bewirkt. Ein Beispiel für einen hard error ist der Single Event Latch-up (SEL).
lexicalization	deu: Single Event Upset